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Re: [avr-gcc-list] Regression tests


From: David Bourgeois
Subject: Re: [avr-gcc-list] Regression tests
Date: Tue, 15 Nov 2005 13:08:29 +0100
User-agent: Opera M2/8.50 (Win32, build 7700)

Hi Claus,

This sounds very exciting!
Is there any place I can learn about it? Any examples lying around?

Thanks,
David

On Tue, 15 Nov 2005 12:58:05 +0100, Klaus Rudolph <address@hidden> wrote:

Hi David,

I have a lot of regression tests running for my embedded code. I use
my simulator (simulavrxx) which also give the ability to manipulate external
pin states and interconnections between multiple avr devices. A lot of
timing parameters could be measured also
under differnt interrupt conditions so that worst case tests could be
done. I think this could never work in real hardware, also jtag give
not full access in real time environment.

Bye
  Klaus


I've seen on the avr-libc-dev list that regression tests were used and on
avr-freaks[1] that one guy was building a test suite for his embedded
applications but he didn't tell anything about how to do it.

My question is wether it's possible or not to use regression tests for C
embedded applications. I can't imagine how this can work with hardware
related functions. What do you use it for in avr-libc developmment?

I coudn't find much information on the subject. I found some keywords like

Avrora, gdb serial protocol, MUL, dejagnu but couldn't get any clear idea
standing out of all this.

Thanks for any clarification,

David Bourgeois, still on his quest towards better programming :-)

[1]

http://www.avrfreaks.net/index.php?name=PNphpBB2&file=viewtopic&t=25684&highlight=regression
"Build a test suite, as early as possible. Start small, and plan for
growth.
Add (at least) one new test for every new feature or resolved bug.
Make it easy and (reasonably) quick to run, so no one has an excuse
for not running it before Every check-in. I have been repeatedly
rescued by the Regression Test Suite when I've inadvertantly stuck my
elbow into something. Moreover, the very exercise of writing the tests
can help point out holes in the specification/design."


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David Bourgeois

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