Re: [Qemu-arm] [PATCH 1/7] tests: add a m25p80 test

[Peter Maydell]

On 4 July 2016 at 13:39, Cédric Le Goater <address@hidden> wrote:
> On 07/04/2016 02:24 PM, Peter Maydell wrote:
>> On 4 July 2016 at 13:18, Cédric Le Goater <address@hidden> wrote:
>>> This test uses the palmetto platform and the AST2400 SPI controller to
>>> test the m25p80 flash module device model. The flash model is defined
>>> by the platform (n25q256a) and it would be nice to find way to control
>>> it, using a property probably.
>>
>>
>>> +static inline void flash_writel(uint32_t data)
>>> +{
>>> +    data = cpu_to_be32(data);
>>> +    memwrite(AST2400_FLASH_BASE, &data, 4);
>>> +}
>>> +
>>> +static inline uint32_t flash_readl(void)
>>> +{
>>> +    uint32_t data;
>>> +
>>> +    memread(AST2400_FLASH_BASE, &data, 4);
>>> +    return be32_to_cpu(data);
>>> +}
>>
>> These are weird. As per my question in the other thread, if you
>> were writing this as a piece of test code that ran natively
>> in the guest, how would you write it?
>
> Here is the uboot flash code :
>
>         
> https://github.com/openbmc/u-boot/blob/v2016.05-aspeed-openbmc/arch/arm/mach-aspeed/flash.c#L420
>
> So these are doing byte per byte, but there is no reason not to do
> long.

If you want "write a long", that is what writel does,
and your test code should be able to use it in exactly
the same way native guest code would write a register
value with a str instruction.

It's very easy to work around endianness issues by
randomly changing things until the tests pass, but it's
much better to actually identify what you need to do
and where the code is diverging from that.

thanks
-- PMM