>
> I agree. In many cases, _TEST is a huge review warning sign that
> subsections should have been used instead.
I can see how the subsections should be used in some cases, but I've
come across at least one case where _TEST was used to avoid the need
for a version change.
Mst's 9e047b (hw/acpi/piix4.c) replaces an existing field, if a property
on the device is set, but if the property is as-before then the structure
stays exactly as it was.
I can see how that probably should have used a subsection for the new
version of the data, but I don't see how it could have otherwise kept
it's compatibility.